Germany – Spectrometers – Photolumineszenz-Mapper-NIR - PR1150863-3240-W

Scope of works

Photoluminescences is a versaille method for characterisation of direct semiconductors. In epitaxy typically whole wafers get PL-mapped to achive information on bandgap, uniformity, layer thickness or cavity dip. The desired tool is capable to measure in a spectral range from 800-2150nm, due to the (AlInGa)(AsP)-heterostructures which are matter of investigations. The setup is capable of mapping entire 2 - 6 inch (50mm - 150mm) wafers. Options: 1. Excitation density tuning for Laser 1 (automized) 2. Laser 2 (DPSS) for InGaAs-contact bleach out for layers with thickness 50 - 200nm 3. Sample holder: Flexible sample positioning on entire chuck with vacuum clamping 4. Sample holder: Mount for DataRay BladeCam2

Type

Invitation to bid / open tender

Tender

Sector

Laboratory & Scientific Equipment

Procedure

neg-w-call

Classification

38433000

Original notice

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Source provenance (1)

Every portal notice that contributed to this record, with the values each one published. Where portals disagree, the originating notice is the published record.

Key dates

1. Published at source02 Sept 2026
2. Submission deadline05 Oct 2026